PDA-7100 Photonic Device Analyzer
Industry-First Dedicated Turn-Key Test System for Silicon Photonics
The PDA-7100 is a next-generation integrated test platform engineered for high-throughput Photonic Device Analysis (PDA). Its architecture is optimized to deliver both the precision required for advanced R&D and the speed demanded by high-volume production environments.
Project-Based Configuration
The PDA-7100 utilizes a task-oriented, project-based architecture that simplifies complex setup procedures. Users instantly configure the entire instrument suite by simply selecting their target device type(e.g., O2O, MRM, MMI, 1DGC, 2DGC).
Unmatched Measurement Throughput
The platform delivers ultra-fast characterization capability, achieving end-to-end measurement and data analysis in “2” seconds from execution start, dramatically accelerating production cycle times.
Optimized for Automated Environments - ABRaEngine™
Built on ABRaEngine™ software, a powerful control platform, the PDA-7100 offers a robust Web-based UI and remote control SCPI that enable seamless integration with automated production equipment, including probe stations and optical coupling systems. Its project-based workflow enables quick setup and consistent measurement execution, helping engineers ramp up faster in silicon photonics testing
HLA-6100 High Power Loss Analyzer
The Industry’s First Fully Automated High-Power Loss Scan Analyzer
The HLA-6100 is not just an instrument; it is a revolutionary breakthrough in Silicon Photonics (SiPh) testing. As the industry’s first fully automated Loss Scan Analyzer specifically designed for high-power conditions, it transforms complex optical characterization into a simple, seamless, and fast process.
